Abstract: Time kinetics of FET aging due to BTI and HCD are simulated by identical physical models in standalone and TCAD frameworks, and calibrated using experimental data from GAA SNS p- and n- FETs ...

Abstract: Electrostatic discharge (ESD) damage evaluation methods for common mode choke (CMC) and ESD suppression devices are standardized in IEC 62228-5 Annex E and Annex F, respectively. The ...