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Onto Innovation Launches Next Generation OCD Metrology Platform to Enable Process Control ...

(NYSE: ONTO) today introduced the Atlas ® G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes. As the ...
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ONTO Unveils Atlas G6 OCD Metrology System for AI-Era Process Control

Onto Innovation Inc. (ONTO) recently augmented its award-winning Atlas family with the introduction of the Atlas G6 optical critical dimension (OCD) metrology system. Designed specifically for the era ...