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This study explores the total-ionizing-dose (TID) and displacement damage (DD) effects in trench silicon carbide (SiC) power MOSFETs. The effects of X-ray irradiation reveal significant negative ...
This paper explores the combined effects of total ionizing dose and displacement damage caused by 250 MeV protons on the Micropac 66266 optocoupler. Proton fluences up to $4 \\times 10^{12}$ were used ...
David Hawthorn is stepping into the role of Chair for the Physics and Astronomy Department, and he’s ready to hit the ground running. He was officially appointed July 1. Learn more about the new Chair ...
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