IEEE

Test Bench for Static, Dynamic and Thermal Cycling Tests of Power Semiconductor Transistors ...

Abstract: Cryogenic electronics remains a promising direction for increasing the power density of power converters. However, the reliability characteristics of power semiconductor components cooled by ...
IEEE

Neutron Radiation Damage in Silicon Transistors

Abstract: In the investigation of base and collector current as a function of the emitter-to-base voltage, previous studies have shown that neutroninduced base current has components originating in ...
C&EN

Low-Voltage p- and n-Type Organic Self-Assembled Monolayer Field Effect Transistors

† Organic Materials and Devices (OMD), Department of Materials Science, University Erlangen-Nürnberg, Martensstrasse 07, 91058 Erlangen, Germany ‡ Institute for Organic Chemistry II, University ...