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Versatile test pattern generator capable of producing a range of test patterns in various high-definition SMPTE formats such as 296M and 274M. The module is ideal for use in the prototyping stages of ...
Abstract: This chapter introduces the designing and implementation of a reduced‐scale doubly fed induction generator (DFIG) test system in the laboratory. It shows the basic scheme of the DFIG test ...
Is there a way to place the AWR1243 into a known output test pattern? Or another method for validating the data interface between the AWR1243 and host? I am looking for a feature that is similar to ...
I'd like to make use of the LVDS/CSI-2 test pattern generator built in to AWR2243 (and other mmWave devices). Is there a simple example that I can start with? If not what is the correct min. sequence ...